They have done a terrific job on our multicore HFCBGA 28nm processor. Access for FIB Circuit Edit was only possible by pre-thinning the 700um thick silicon from the backside. Followed by silicon trenching to expose the N-wells to obtain access … Read the rest

Director of development

Backside FIB circuit edit on 28nm node

We have done the fault localization on our device ourselves using Optical Beam Induced Resistance Change (OBIRCH). However we did not have the tools or the skills to do the destructive physical analysis (DPA). These guys of ChipRebel provided us … Read the rest

Senior Device Engineer

particle shorting gate to source