We have done the fault localization on our device ourselves using Optical Beam Induced Resistance Change (OBIRCH). However we did not have the tools or the skills to do the destructive physical analysis (DPA). These guys of ChipRebel provided us clear images of the root cause but also resolved what kind of contamination it was. They did it accurately and fast. Meanwhile they have done several jobs for us, always satisfying.
Senior Device Engineer
particle shorting gate to source
